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Our DSO-LCR500 combines the advantages of a digital oscilloscope and a multifunctional component tester in a compact and high-quality case. With the help of the digital oscilloscope, ambitious tinkerers can evaluate time-dependent signals without having to resort to expensive measurement technology.
The multifunctional component tester also allows fast and automatic detection of components. Furthermore, our DSO-LCR500 has additional helpful functions such as a signal generator, an infrared signal decoder and measurement of Zener diodes, DS18B20 sensors and DHT11 sensors.
The device is equipped with a 1500 mAh rechargeable battery, which can be conveniently charged via USB-C. The integrated, fold-out stand additionally eases the operation.
Specifications:
- Funktions:
- Digital oscilloscope
- Component tester
- Continuity tester
- Signal generator
- Measurement of Zener diodes
- Measurement of DS18B20 sensors
- Measurements of DHT11 sensors
- Infrared decoder
- Stand funktion: Integrated 90° foldable stand
- Battery: 1500 mAh lithium battery, rechargeable via USB-C
- Display: 2,4“ TFT color display, LED-backlight, 320x240 pixel
- Available languages: English, German
- Sampling rate: 10 MS/s
- Analog bandwidth: 0 - 500 kHz
- Input resistance: 1 M?
- Coupling: AC / DC
- Test voltage range:
- 1:1: 80Vpp (- 40 V - 40 V)
- 10:1: 800Vpp (- 400 V - 400 V)
- Vertical sensitivity: 10 mV/Div - 10 V/Div
- Horizontal time base: 10 ?s - 10s
- Trigger modes:
- Trigger types:
- Triode-measurements (HFE > 10, HFE < 600):
- Amplification (hFE)
- base-emitter-voltage (Ube)
- collector-emitter reverse
- cut-off current (Iceo, Ices)
- protection diode forward
- voltage drop (Uf)
- Diode-measurements (forward voltage drop < 5 V): Forward voltage drop, junction capacitance, reverse leakage current
- Zener-diode-measurements (1 -2 -3 testing range: 0,01 - 4,5 V, K - A - A testing range: 0,01 - 24 V):
- 1-2-3: Forward voltage drop, reverse breakdown voltage
- K-A-A: reverse breakdown voltage
- Field effect transistor measurements (JFET, IGBT, MOSFET):
- JFET: Gate capacitance(Cg), drain current (Id at Vgs), protection diode forward
voltage drop (Uf)
- IGBT: drain current (Id at Vgs), protection diode forward voltage drop (Uf)
- MOSFET: turn-on voltage (Vt), gate capacitance (Cg), drain-source resistance (Rds), protection diode forward voltage drop (Uf)
- Silicon controlled rectifier & triac measurements (turn on voltafe < 5 V, gate trigger current < 6 MA): Gate voltage
- Capacitor measurements (25 PF - 100 MF): Capacity, loss factor (Vloss)
- Resistor measurements (0,01 ? - 50 M?): Resistance
- Inductor measurements (10 uH - 1000 uH): Inductance value, DC resistance
- Battery meansurements (0,01 - 4,5 V): Voltage value, positive & negative polarity
- Input voltage measurements (0 - 16 V): Voltage value
- Signal generator (sine wave): 1 - 100 kHz, 0 - 3,3 V, 50%
- Signal generator (square wave): 1 - 100 kHz, 3,3 V, 50%
- Signal generator (pulse wave): 1 - 100 kHz, 3,3 V, 0 - 100%
- Signal generator (triangle wave): 1 - 100 kHz, 0 - 3,3 V, 50%
- Signal generator (ramp wave): 1 - 100 kHz, 0 - 3,3 V, 0 - 100%
- Signal generator (DC): 0 - 3,3 V
- DS18B20 Measurements: Temperature
- DHT11 Measurements: Temperature & humidity
- Infrared decoding (nec protocoll): Display user & data code, display infrared waveform
- Testing functions: Continuity test, Voltages up to 40 V
- Test probe connection on the device: Micro Coaxial Connector (MCX)
- Dimensions: 180 x 150 x 77 mm
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